STRUCTURAL STUDY OF PBTE FILMS GROWN ON BAF2 BY HOT WALL EPITAXY

被引：5

作者：

STOEMENOS, J ^{[1
]}

ZHELEVA, NN ^{[1
]}

KOPARANOVA, MH ^{[1
]}

机构：

[1] UNIV SOFIA,SEMICOND PHYS & TECHNOL RES INST,BU-1126 SOFIA,BULGARIA

来源：

JOURNAL OF CRYSTAL GROWTH | 1989年 / 97卷 / 02期

关键词：

D O I：

10.1016/0022-0248(89)90225-X

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：443 / 452

页数：10

共 24 条

[1] CONTRAST FROM ATOMIC SURFACE STEPS USING TEM [J].

ANTONOPOULOS, JG .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1976, 38 (02) :K115-&

[2] DIRECT RESOLUTION OF SURFACE ATOMIC STEPS BY TRANSMISSION ELECTRON-MICROSCOPY [J].

CHERNS, D .

PHILOSOPHICAL MAGAZINE, 1974, 30 (03) :549-556

[3] GROWTH AND CHARACTERIZATION OF PBTE EPITAXIAL-FILMS GROWN BY HOT-WALL EPITAXY [J].

CLEMENS, H ;

FANTNER, EJ ;

RUHS, W ;

BAUER, G .

JOURNAL OF CRYSTAL GROWTH, 1984, 66 (02) :251-256

[4]

DISTLER GI, 1971, SOV PHYS CRYSTALLOGR, V16, P171

[5]

DUPUY M, 1984, J MICROSC SPECT ELEC, V9, P163

[6] INTERFACIAL FREE ENERGY OF COHERENT TWIN BOUNDARIES IN COPPER [J].

FULLMAN, RL .

JOURNAL OF APPLIED PHYSICS, 1951, 22 (04) :448-455

[7]

Hirth J. P., 1967, PHYS THIN FILMS, V4, P97

[8]

HOHNKE DK, 1976, THIN SOLID FILMS, V38, P46

[9] EPITAXIAL GROWTH OF LEAD TIN TELLURIDE [J].

HOLLOWAY, H ;

LOGOTHETIS, EM ;

WILKES, E .

JOURNAL OF APPLIED PHYSICS, 1970, 41 (08) :3543-+

[10]

HOLLOWAY H, 1980, PHYS THIN FILMS, V11, P105

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