APPLICATIONS OF RESONANT-TUNNELING FIELD-EFFECT TRANSISTORS

被引:10
|
作者
WOODWARD, TK [1 ]
MCGILL, TC [1 ]
CHUNG, HF [1 ]
BURNHAM, RD [1 ]
机构
[1] XEROX CORP,PALO ALTO,CA 94304
关键词
SEMICONDUCTOR DEVICES; FIELD EFFECT - Applications;
D O I
10.1109/55.2062
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Flip-flop and frequency-doubling operations are demonstrated, using a simple circuit that combines a resistor with a three-terminal negative-resistance device. The device is a series integration of a resonant-tunneling heterostructure with a field-effect transistor. Results, obtained at 77 K, are presented for two samples that were grown by metalorganic chemical vapor deposition.
引用
收藏
页码:122 / 124
页数:3
相关论文
共 50 条
  • [41] THz resonant-tunneling diodes, oscillators, detectors, and applications
    Feiginov, Michael
    TERAHERTZ PHOTONICS II, 2022, 12134
  • [42] Terahertz Emitter Using Resonant-Tunneling Diode and Applications
    Asada, Masahiro
    Suzuki, Safumi
    SENSORS, 2021, 21 (04) : 1 - 20
  • [43] Organic field-effect transistors for biosensing applications
    Goetz, S. M.
    Erlen, C. M.
    Grothe, H.
    Wolf, B.
    Lugli, P.
    Scarpa, G.
    ORGANIC ELECTRONICS, 2009, 10 (04) : 573 - 580
  • [44] THE EFFECT OF COULOMB-BLOCKADE ON RESONANT-TUNNELING
    BAHLOULI, H
    PHYSICS LETTERS A, 1994, 193 (5-6) : 485 - 490
  • [45] Tunneling Magnetoresistance Properties in Ballistic Spin Field-Effect Transistors
    Jiang, Kai-Ming
    Zhang, Rong
    Yang, Jun
    Yue, Chun-Xiao
    Sun, Zu-Yao
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2010, 57 (08) : 2005 - 2012
  • [46] The Performance of Uniaxially Strained Phosphorene Tunneling Field-Effect Transistors
    Seo, Junbeom
    Jung, Sungwoo
    Shin, Mincheol
    IEEE ELECTRON DEVICE LETTERS, 2017, 38 (08) : 1150 - 1152
  • [47] Thermionic and tunneling transport mechanisms in graphene field-effect transistors
    Ryzhii, Victor
    Ryzhii, Maxim
    Otsuji, Taiichi
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2008, 205 (07): : 1527 - 1533
  • [48] The Impact of a Single Displacement Defect on Tunneling Field-Effect Transistors
    Kim, Jungsik
    Han, Jin-Woo
    Meyyappan, M.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2020, 67 (11) : 4765 - 4769
  • [49] Experimental Studies of Reliability Issues in Tunneling Field-Effect Transistors
    Jiao, G. F.
    Chen, Z. X.
    Yu, H. Y.
    Huang, X. Y.
    Huang, D. M.
    Singh, N.
    Lo, G. Q.
    Kwong, D. -L.
    Li, Ming-Fu
    IEEE ELECTRON DEVICE LETTERS, 2010, 31 (05) : 396 - 398
  • [50] Simulation of tunneling field-effect transistors with extended source structures
    Yang, Yue
    Guo, Pengfei
    Han, Genquan
    Low, Kain Lu
    Zhan, Chunlei
    Yeo, Yee-Chia
    JOURNAL OF APPLIED PHYSICS, 2012, 111 (11)