TRANSMISSION ELECTRON-MICROSCOPY OF NIOBIUM AND TANTALUM HYDRIDES

被引：0
作者：
SCHOBER, T [1 ]
机构：
[1] KFA JULICH GMBH,INST FESTKORPERFORSCH,D-5170 JULICH 1,FED REP GER
来源：
MIKROSKOPIE | 1978年 / 34卷 / 5-6期
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：135 / 135
页数：1
相关论文
共 50 条
  • [41] TRANSMISSION ELECTRON-MICROSCOPY IN EARTH SCIENCES
    MELLINI, M
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1982, 7 (03): : A38 - A39
  • [42] APPLICATIONS OF TRANSMISSION ELECTRON-MICROSCOPY TO COAL
    WERT, CA
    HSIEH, KC
    BUCKENTIN, M
    TSENG, BH
    SCANNING MICROSCOPY, 1988, 2 (01) : 83 - 96
  • [43] MULTILAYERS OBSERVED BY TRANSMISSION ELECTRON-MICROSCOPY
    LEPETRE, Y
    CHARAI, A
    THIN SOLID FILMS, 1983, 105 (01) : 71 - 74
  • [44] TRANSMISSION ELECTRON-MICROSCOPY OF INTERMEDIATE PLAGIOCLASES
    HOBBS, BE
    MCLAREN, AC
    TRANSACTIONS-AMERICAN GEOPHYSICAL UNION, 1972, 53 (04): : 549 - &
  • [45] SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
    CREWE, AV
    JOURNAL OF MICROSCOPY-OXFORD, 1974, 100 (APR): : 247 - 259
  • [46] TRANSMISSION ELECTRON-MICROSCOPY OF CERIA GELS
    DESPORT, JA
    MOSELEY, PT
    WILLIAMS, DE
    JOURNAL OF MATERIALS SCIENCE LETTERS, 1982, 1 (07) : 288 - 291
  • [47] TRANSMISSION ELECTRON-MICROSCOPY ON METEORITIC TROILITE
    TOPELSCHADT, J
    MULLER, WF
    PHYSICS AND CHEMISTRY OF MINERALS, 1982, 8 (04) : 175 - 179
  • [48] STUDY OF MICROCIRCUITS BY TRANSMISSION ELECTRON-MICROSCOPY
    HAM, WE
    ABRAHAMS, MS
    BLANC, J
    BUIOCCHI, CJ
    RCA REVIEW, 1977, 38 (03): : 351 - &
  • [49] THE CYTOARCHITECTURE OF THE ADRENAL CHROMAFFIN CELL AS VISUALIZED BY SCANNING ELECTRON-MICROSCOPY AND TRANSMISSION ELECTRON-MICROSCOPY
    CARMICHAEL, SW
    ULRICH, RG
    ANATOMICAL RECORD, 1982, 202 (03): : A27 - A28
  • [50] EBIC SCANNING ELECTRON-MICROSCOPY AND TRANSMISSION ELECTRON-MICROSCOPY OF SILICON GRAIN-BOUNDARIES
    MAURICE, JL
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1988, 13 (03): : A31 - A31
12345