SOME DIFFUSION AND SOLUBILITY MEASUREMENTS OF CU IN CDTE

被引：73
|
作者：
WOODBURY, HH
AVEN, M
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1968年 / 39卷 / 12期
关键词：
D O I：
10.1063/1.1655999
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：5485 / &
相关论文
共 50 条
  • [31] Some measurements of gaseous diffusion.
    Mullaly, JM
    NATURE, 1924, 113 : 711 - 712
  • [32] Some annealing effects on rf sputtered Cu/Te/CdTe structure
    Debbagh, F
    Ameziane, EL
    Azizan, M
    Brunel, M
    Nguyen, TTA
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1996, 38 (03): : 223 - 227
  • [33] Crystal Growth and Atom Diffusion in (Cu)ZnTe/CdTe via Molecular Dynamics
    Aguirre, Rodolfo
    Chavez, Jose Juan
    Li, Jiaojiao
    Zhou, Xiao Wang
    Almeida, Sergio F.
    Wolden, Colin
    Zubia, David
    IEEE JOURNAL OF PHOTOVOLTAICS, 2018, 8 (02): : 594 - 599
  • [34] MINORITY-CARRIER DIFFUSION LENGTH MEASUREMENTS IN GAAS AND CDTE BY A PHOTOCURRENT TECHNIQUE
    LASTRASMARTINEZ, A
    DORANTES, J
    RACCAH, PM
    TRIBOULET, R
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1980, 25 (03): : 409 - 409
  • [35] DIFFUSION, PENETRATION AND SOLUBILITY OF HYDROGEN IN ALLOY CU3AU
    GOLTSOV, VA
    GELD, PV
    VYKHODET.VB
    KRYLOVA, TA
    PHYSICS OF METALS AND METALLOGRAPHY-USSR, 1970, 30 (03): : 216 - &
  • [36] FUSED ZINC CHLORIDE .2. SOME SOLUBILITY MEASUREMENTS
    KERRIDGE, DH
    STURTON, IA
    INORGANICA CHIMICA ACTA, 1974, 8 (01) : 27 - 30
  • [37] CHLORINE DIFFUSION IN CDTE
    SADAIYANDI, K
    RAMACHANDRAN, K
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1990, 160 (02): : K85 - K88
  • [38] THE DIFFUSION OF MN IN CDTE
    JAMIL, NY
    SHAW, D
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1995, 10 (07) : 952 - 958
  • [39] Diffusion of phosphorus in CdTe
    E. Hoonnivathana
    E. D. Jones
    I. V. F. Viney
    L. J. Duckers
    Journal of Electronic Materials, 1998, 27 : 610 - 614
  • [40] Diffusion of phosphorus in CdTe
    Hoonnivathana, E
    Jones, ED
    Viney, IVF
    Duckers, LJ
    JOURNAL OF ELECTRONIC MATERIALS, 1998, 27 (06) : 610 - 614
12345