NIRSE - NORMAL-INCIDENCE ROTATING-SAMPLE ELLIPSOMETER

被引：24

作者：

AZZAM, RMA

机构：

[1] UNIV NEBRASKA,MED CTR,DIV HEMATOL,OMAHA,NE 68105

[2] UNIV NEBRASKA,MED CTR,DEPT INTERNAL MED,OMAHA,NE 68105

[3] UNIV NEBRASKA,COLL ENGN,ELECT MAT LAB,LINCOLN,NE 68588

来源：

OPTICS COMMUNICATIONS | 1977年 / 20卷 / 03期

关键词：

D O I：

10.1016/0030-4018(77)90215-2

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：405 / 408

页数：4

共 9 条

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STUDNA, AA .

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[3] PIE - PERPENDICULAR-INCIDENCE ELLIPSOMETRY-APPLICATION TO DETERMINATION OF OPTICAL-PROPERTIES OF UNIAXIAL AND BIAXIAL ABSORBING CRYSTALS [J].

AZZAM, RMA .

OPTICS COMMUNICATIONS, 1976, 19 (01) :122-124

[4]

AZZAM RMA, TO BE PUBLISHED

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JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1974, 64 (05) :631-638

[6] DESIGN AND OPERATION OF ETA, AN AUTOMATED ELLIPSOMETER [J].

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DILL, FH .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1973, 17 (06) :472-489

[7]

Heavens O.S, 1955, OPTICAL PROPERTIES T

[8] MODULATED ELLIPSOMETER FOR STUDYING THIN-FILM OPTICAL PROPERTIES AND SURFACE DYNAMICS [J].

JASPERSON, SN ;

BURGE, DK ;

OHANDLEY, RC .

SURFACE SCIENCE, 1973, 37 (01) :548-558

[9]

MCCRACKIN FL, 1964, NBS256 MISC PUBL, P66

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