A NEW APPROACH TO THE BIASING PROBLEM AND THE FAULT LOCALIZATION OF NON-LINEAR ELECTRONIC-CIRCUITS

被引：3

作者：

THEEUWEN, JFM

JESS, JAG

机构：

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS | 1982年 / 29卷 / 03期

关键词：

D O I：

10.1109/TCS.1982.1085124

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：125 / 135

页数：11

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