MICROSCOPIC SCREENING AND PHONON-DISPERSION IN GERMANIUM

被引:2
作者
VANCAMP, PE [1 ]
VANDOREN, VE [1 ]
DEVREESE, JT [1 ]
机构
[1] UNIV INSTELLING ANTWERP,B-2610 WILRIJK,BELGIUM
来源
PHYSICAL REVIEW B | 1979年 / 20卷 / 12期
关键词
D O I
10.1103/PhysRevB.20.5408
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper shows results for the phonon dispersion of Ge in an extreme-tight-binding calculation for different values of the ionic-pseudopotential parameters. It is found that in this model meaningful results, comparable to experiment, can be obtained for the macroscopic dielectric function but not for phonon frequencies, in contradiction with a claim made in a paper by Arya and Jha. Similar results are obtained for C and Si. This indicates that the extreme-tight-binding band model is too simple to be useful in phonondispersion calculations. The present authors have shown elsewhere that the inclusion of the higher bands and the consistency between electron-ion and crystal pseudopotential play an essential role in obtaining meaningful phonon frequencies for semiconductors. © 1979 The American Physical Society.
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页码:5408 / 5411
页数:4
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