SCANNING TUNNELING MICROSCOPY CHARACTERIZATION OF THE GEOMETRIC AND ELECTRONIC-STRUCTURE OF HYDROGEN-TERMINATED SILICON SURFACES

被引：94

作者：

KAISER, WJ

BELL, LD

HECHT, MH

GRUNTHANER, FJ

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575372

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：519 / 523

页数：5

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