AUTOMATIC OPTICAL THICKNESS GAUGE FOR THIN FILM MEASUREMENTS

被引:5
|
作者
MURRAY, TP
机构
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 1962年 / 33卷 / 02期
关键词
D O I
10.1063/1.1746529
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:172 / &
相关论文
共 50 条
  • [1] Research of an automatic system monitoring thickness of optical thin-film
    Zhu, Mei-Ping
    Yi, Kui
    Guo, Shi-Hai
    Fan, Zheng-Xiu
    Shao, Jian-Da
    Guangzi Xuebao/Acta Photonica Sinica, 2007, 36 (02): : 308 - 311
  • [2] THIN-FILM THICKNESS STEP GAUGE
    GUPTA, SK
    KAPIL, AK
    SINGAL, CM
    SRIVASTAVA, VK
    PRAMANA, 1976, 7 (06) : 397 - 400
  • [3] A Review of Thin-film Thickness Measurements using Optical Methods
    Park, Jungjae
    Cho, Yong Jai
    Chegal, Won
    Lee, Joonyoung
    Jang, Yoon-Soo
    Jin, Jonghan
    INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, 2024, 25 (08) : 1725 - 1737
  • [4] Heterodyne interferometer for film thickness and refractive index measurements of optical thin-film
    Shimizu, N
    Yuguchi, J
    Takahashi, H
    INTERNATIONAL SYMPOSIUM ON POLARIZATION ANALYSIS AND APPLICATIONS TO DEVICE TECHNOLOGY, 1996, 2873 : 123 - 126
  • [5] THIN-FILM THICKNESS MEASUREMENTS
    KHATNIKOV, VI
    PRIBORY I TEKHNIKA EKSPERIMENTA, 1974, (06): : 194 - 195
  • [6] THIN FILM THICKNESS MEASUREMENTS.
    Flood, Per R.
    Scanning Electron Microscopy, 1980, : 183 - 200
  • [7] THICKNESS MEASUREMENTS OF SHARP THIN FILM STEPS
    BAILEY, GC
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1966, 37 (09): : 1260 - &
  • [8] DETERMINATION OF THE OPTICAL-CONSTANTS OF A THIN-FILM FROM TRANSMITTANCE MEASUREMENTS OF A SINGLE FILM THICKNESS
    PALMER, KF
    WILLIAMS, MZ
    APPLIED OPTICS, 1985, 24 (12): : 1788 - 1798
  • [9] Automated optical film-thickness measurements
    Kloeppel, JE
    TRAC-TRENDS IN ANALYTICAL CHEMISTRY, 2000, 19 (08) : III - IV
  • [10] Optical fibre thin film thickness monitor
    Caranto, N.R.Y.
    Kaddu, S.C.
    Szajman, J.
    Murphy, M.M.
    Collins, S.F.
    Booth, D.J.
    Engineering optics, 1993, 6 (04): : 451 - 455