HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY STUDIES OF SEEDED EPITAXIAL CO/PT SUPERLATTICES

被引：35

作者：

CHIEN, CJ ^{[1
]}

FARROW, RFC ^{[1
]}

LEE, CH ^{[1
]}

LIN, CJ ^{[1
]}

MARINERO, EE ^{[1
]}

机构：

[1] IBM CORP,DIV RES,ALMADEN RES CTR,SAN JOSE,CA 95120

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1991年 / 93卷

关键词：

D O I：

10.1016/0304-8853(91)90302-Q

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this paper we describe the results of high-resolution transmission electron microscopy studies of MBE-grown Co/Pt superlattices. These studies were made on superlattices grown along the three major axes of Pt: [111], [110], [001], on Ag films grown on GaAs substrates. Cross-section, transmission electron micrographs of [3.2 angstrom Co-16.7 angstrom Pt]n superlattices reveal a high density of stacking faults on the (111) planes for [111] oriented superlattices. In addition, plane-view transmission electron diffraction patterns showed intense Bragg diffractions originating from a high density of steps and stacking faults in the superlattice. For the [110] and [001] oriented superlattices stacking faults were not observed. It is suggested that a combination of limited interdiffusion, partial ordering of the alloy and stacking faults may contribute to the perpendicular anisotropy observed for the [111] superlattices.

引用

页码：47 / 52

页数：6

共 11 条

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[Anonymous], P INT C MAGN I PHYS

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