APPLICATIONS OF LOW AND HIGH-TC THIN-FILM DEVICES TO METROLOGY

被引：0
|
作者：
GALLOP, JC
机构：
来源：
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1990年 / 111期
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暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Thin films of high temperature superconductors already exhibit very promising properties compared with other forms of these complex perovskites. Early applications of devices made with the HTS materials may be expected to come in the field of precise measurements, in view of the importance of conventional thin-film superconducting devices to this field.
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页码：261 / 272
页数：12
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