THE MEASUREMENT OF THIN FILM THICKNESS BY INTERFEROMETRY

被引：9
|
作者：
TOLANSKY, S
机构：
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1951年 / 41卷 / 06期
关键词：
D O I：
10.1364/JOSA.41.000425
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：425 / 426
页数：2
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