THE EFFECTS OF TEST CONDITIONS ON MOS RADIATION-HARDNESS RESULTS

被引：58
作者：
DRESSENDORFER, PV
SODEN, JM
HARRINGTON, JJ
NORDSTROM, TV
机构：
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1981年 / 28卷 / 06期
关键词：
D O I：
10.1109/TNS.1981.4335713
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：4281 / 4287
页数：7
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