THERMAL IMPEDANCE MEASUREMENT OF SEMICONDUCTOR-LASERS

被引:3
作者
BHUMBRA, BS
THOMPSON, GHB
WRIGHT, AP
机构
[1] BNR Europe Limited, Harlow, Essex CM17 9NA, London Road
关键词
HEAT TRANSFER; SEMICONDUCTOR JUNCTION LASERS;
D O I
10.1049/el:19940554
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Methods of measuring thermal impedance of lasers have traditionally compared devices under CW and pulsed current operation where it is assumed that heating is negligible for the latter. This assumption is untrue as heating still occurs within the duration of the current pulse. The authors describe an improved method for the measurement of thermal impedance.
引用
收藏
页码:793 / 794
页数:2
相关论文
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