STRUCTURAL CHARACTERIZATION BY LOW-ENERGY AUGER-ELECTRON AND PHOTOELECTRON SCATTERING

被引：40

作者：

IDZERDA, YU

RAMAKER, DE

机构：

[1] Naval Research Laboratory, Washington

来源：

PHYSICAL REVIEW LETTERS | 1992年 / 69卷 / 13期

关键词：

D O I：

10.1103/PhysRevLett.69.1943

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The angle-resolved electron intensity patterns of low energy Auger electrons and photoelectrons are calculated using a quantum mechanical electron scattering formalism with the inclusion of appropriate electron angular momentum. Calculations indicate that scattering of high angular momentum and low energy electrons exhibit minima in the forward direction whereas low angular momenta or high energy electrons exhibit maxima, as is experimentally observed. Comparison of experimental and theoretical patterns allows for detailed structural characterizations.

引用

页码：1943 / 1946

页数：4

共 50 条

[31] APPLICATION OF A NOVEL MULTIPLE-SCATTERING APPROACH TO PHOTOELECTRON DIFFRACTION AND AUGER-ELECTRON DIFFRACTION [J].

KADUWELA, AP ;

FRIEDMAN, DJ ;

FADLEY, CS .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1991, 57 (3-4) :223-278

[32] Coincidence photoelectron and Auger-electron spectral behaviors of Auger cascade decay [J].

Ohno, Masahide .

CHEMICAL PHYSICS, 2012, 405 :137-147

[33] LOW-ENERGY ION INDUCED AUGER-ELECTRON SPECTRA AND ENERGY THRESHOLDS FOR SOME PURE ELEMENTS, COMPOUNDS, AND ALLOYS [J].

FAN, CZ ;

YU, ZJ ;

CHEN, XK .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04) :1206-1208

[34] Unique features of photoelectron/Auger-electron coincidence experiments [J].

Schmidt, V .

X-RAY AND INNER-SHELL PROCESSES, 2000, 506 :132-147

[35] COMMENTARY ON PHOTOELECTRON, AUGER-ELECTRON, AND METASTABLE DEEXCITATION SPECTROSCOPY [J].

JOYNER, RW .

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1986, 318 (1541) :59-60

[36] AUGER-ELECTRON AND X-RAY PHOTOELECTRON SPECTROSCOPIES [J].

HOCHELLA, MF .

REVIEWS IN MINERALOGY, 1988, 18 :573-637

[37] STRUCTURAL CHARACTERIZATION OF METAL-METAL INTERFACES BY INTERMEDIATE-ENERGY AUGER-ELECTRON DIFFRACTION [J].

CHAMBERS, SA ;

ANDERSON, SB ;

WEAVER, JH .

PHYSICAL REVIEW B, 1985, 32 (08) :4872-4875

[38] LOW-ENERGY AUGER-ELECTRON SPECTROSCOPY OF CLEAN AND OXIDIZED CU(100) AND FE/CU(100) SURFACES [J].

DENDAAS, H ;

GIJZEMAN, OLJ ;

GEUS, JW .

SURFACE AND INTERFACE ANALYSIS, 1992, 18 (06) :397-402

[39] EFFECT OF ION-BOMBARDMENT AT LOW-ENERGY ON (100)INP SURFACES, STUDIED BY AUGER-ELECTRON SPECTROSCOPY [J].

ACHARD, B ;

GRUZZA, B ;

PARISET, C .

SURFACE SCIENCE, 1985, 160 (02) :L519-L523

[40] AUGER-ELECTRON SPECTROSCOPY IN SPUTTERING MEASUREMENTS - APPLICATION TO LOW-ENERGY AR+ SPUTTERING OF AG AND NB [J].

SMITH, JN ;

MEYER, CH ;

LAYTON, JK .

JOURNAL OF APPLIED PHYSICS, 1975, 46 (10) :4291-4293

← 1 2 3 4 5 →