STRUCTURAL CHARACTERIZATION BY LOW-ENERGY AUGER-ELECTRON AND PHOTOELECTRON SCATTERING

被引：40
作者：
IDZERDA, YU
RAMAKER, DE
机构：
[1] Naval Research Laboratory, Washington
来源：
PHYSICAL REVIEW LETTERS | 1992年 / 69卷 / 13期
关键词：
D O I：
10.1103/PhysRevLett.69.1943
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The angle-resolved electron intensity patterns of low energy Auger electrons and photoelectrons are calculated using a quantum mechanical electron scattering formalism with the inclusion of appropriate electron angular momentum. Calculations indicate that scattering of high angular momentum and low energy electrons exhibit minima in the forward direction whereas low angular momenta or high energy electrons exhibit maxima, as is experimentally observed. Comparison of experimental and theoretical patterns allows for detailed structural characterizations.
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页码：1943 / 1946
页数：4
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