NEW DEVICE ROTATES CRYSTAL WHISKERS IN ELECTRON MICROSCOPE

被引：0
作者：
FRIDMAN, VY
机构：
来源：
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR | 1970年 / 05期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：1537 / &
相关论文
共 50 条
  • [21] DEVICE FOR MEASURING ELECTRON-MICROSCOPE FILAMENTS
    SMITH, W
    GRAY, EW
    WATSON, DG
    MICRON, 1978, 9 (03) : 161 - 161
  • [22] SPECIMEN TENSILE DEFORMATION DEVICE FOR THE ELECTRON MICROSCOPE
    TAKAHASHI, N
    ASHINUMA, K
    WATANABE, M
    OKAZAKI, I
    NAGAHAMA, Y
    JOURNAL OF ELECTRON MICROSCOPY, 1960, 9 (02): : 104 - 107
  • [23] DEVICE FOR DEEP REFRIGERATION OF OBJECTS IN AN ELECTRON MICROSCOPE
    DARINSKAYA, EV
    ROZHANSKII, VN
    CRYOGENICS, 1970, 10 (06) : 505 - +
  • [24] A TECHNIQUE FOR REPLICATING FRACTURED CROSS SECTIONS OF GRAPHITE WHISKERS FOR ELECTRON MICROSCOPE EXAMINATION
    KOCH, EF
    HOLIK, AS
    JOURNAL OF ELECTRON MICROSCOPY, 1962, 11 (02): : 131 - 132
  • [25] The Electron Scattering on Local Potential of Crystal Defects in GaSb Whiskers
    Druzhinin, A. A.
    Ostrovskii, I. P.
    Khoverko, Yu. N.
    Khytruk, I. I.
    JOURNAL OF NANO- AND ELECTRONIC PHYSICS, 2015, 7 (04)
  • [26] A TECHNIQUE FOR REPLICATING SINGLE CRYSTAL IRON WHISKERS FOR ELECTRON MICROSCOPY
    SCOTT, RL
    JOURNAL OF ELECTRON MICROSCOPY, 1960, 8 : 31 - 37
  • [27] A new scanning electron microscope
    Stewart, ADG
    Snelling, MA
    ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 133, 2004, 133 : 335 - 337
  • [28] NEW ELECTRON MICROSCOPE FOR CANADA
    不详
    NATURE, 1945, 155 (3936) : 422 - 422
  • [29] A NEW EXPERIMENTAL ELECTRON MICROSCOPE
    LIEBMANN, G
    JOURNAL OF SCIENTIFIC INSTRUMENTS AND OF PHYSICS IN INDUSTRY, 1948, 25 (02): : 37 - 43
  • [30] CRYSTAL INTERFERENCE PHENOMENA IN ELECTRON MICROSCOPE IMAGES
    HEIDENREICH, RD
    STURKEY, L
    JOURNAL OF APPLIED PHYSICS, 1945, 16 (02) : 97 - 105
12345