HIGH-FREQUENCY PHOTOMAGNETOELECTRIC METHOD FOR DETERMINING SEMICONDUCTOR PARAMETERS

被引：5
作者：
KONCZAK, S
KOTEWICZ, K
NOWAK, M
机构：
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1981年 / 65卷 / 02期
关键词：
D O I：
10.1002/pssa.2210650205
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：447 / 451
页数：5
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