X-RAY HOLOGRAPHIC INTERFEROMETRY IN DETERMINATION OF PLANAR MULTILAYER STRUCTURES - THEORY AND EXPERIMENTAL OBSERVATIONS

被引：31
作者：
LESSLAUER, W
BLASIE, JK
机构：
来源：
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY | 1971年 / A 27卷 / SEP1期
关键词：
D O I：
10.1107/S0567739471001001
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
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页码：456 / +
页数：1
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