WAVEFORM MEASUREMENTS ON GIGAHERTZ SEMICONDUCTOR-DEVICES BY SCANNING ELECTRON-MICROSCOPE STROBOSCOPY

被引：10
作者：
FUJIOKA, H
URA, K
机构：
来源：
APPLIED PHYSICS LETTERS | 1981年 / 39卷 / 01期
关键词：
D O I：
10.1063/1.92524
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：81 / 82
页数：2
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