SOFTWARE-RELIABILITY GROWTH-MODEL WITH DEBUGGING EFFORTS

被引：5

作者：

LEUNG, YW

机构：

[1] Department of Information Engineering, The Chinese University of Hong Kong, Shatin

来源：

MICROELECTRONICS AND RELIABILITY | 1992年 / 32卷 / 05期

关键词：

D O I：

10.1016/0026-2714(92)90627-W

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper we propose a software reliability growth model in which resources are expended in both testing the software and removing the detected errors. The mean number of errors that can be removed is related to the amount of available resources. Based on this model, we formulate and solve two resource allocation problems for software modules testing: minimization of final error content when a fixed amount of resources is given and minimization of the required amount of resources when a final error content requirement is given.

引用

页码：699 / 704

页数：6

共 7 条

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OHTERA, H
YAMADA, S
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[4] RAMAMCORTHY CV, 1982, IEEE T SOFTWARE ENG, V8, P904
[5] SOFTWARE-RELIABILITY GROWTH MODELING - MODELS AND APPLICATIONS
YAMADA, S
OSAKI, S
[J]. IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1985, 11 (12) : 1431 - 1437
[6] Yamada S., 1986, IEEE T RELIABILITY, VR-35
[7] OPTIMUM SOFTWARE RELEASE POLICY WITH RANDOM LIFE-CYCLE
YUN, WY
BAI, DS
[J]. IEEE TRANSACTIONS ON RELIABILITY, 1990, 39 (02) : 167 - 170

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