Terahertz Imaging System Components Based on PbSnTe : In Films

被引：0
作者：
Galkin, P. S. [1 ]
Igumenov, I. K. [1 ]
Klimov, A. E. [2 ]
Kubarev, V. V. [3 ]
Neizvestny, I. G. [2 ]
Pashchin, N. S. [2 ]
Chesnokov, E. N. [4 ]
Shumskii, V. N. [2 ]
机构：
[1] Russian Acad Sci, Nikolaev Inst Inorgan Chem, Siberian Branch, Pr Akad Lavrenteva 3, Novosibirsk 630090, Russia
[2] Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, Russia
[3] Russian Acad Sci, Budker Inst Nucl Phys, Siberian Branch, Novosibirsk 630090, Russia
[4] Russian Acad Sci, Inst Chem Kinet & Combust, Siberian Branch, Novosibirsk 630090, Russia
来源：
OPTOELECTRONICS INSTRUMENTATION AND DATA PROCESSING | 2009年 / 45卷 / 04期
基金：
俄罗斯基础研究基金会;
关键词：
terahertz radiation; free-electron laser; fine levels; imaging systems;
D O I：
10.3103/S8756699009040128
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
This paper reports the results of experimental studies and calculations of components of a model system for detection and imaging in the terahertz range, including a free-electron laser and devices for laser radiation diagnostics, film shields with absorbing coatings for intermediate thermal imaging, and prototype sensitive elements based on PbSnTe : In films.
引用
收藏
页码：353 / 360
页数：8
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