SPATIALLY-RESOLVED ELECTRON-ENERGY-LOSS NEAR-EDGE STRUCTURE-ANALYSIS OF A NEAR SIGMA=11 TILT BOUNDARY IN SAPPHIRE

被引:77
作者
BRULEY, J
机构
来源
MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1993年 / 4卷 / 01期
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D O I
10.1051/mmm:019930040102300
中图分类号
TH742 [显微镜];
学科分类号
摘要
Spatially resolved electron energy-loss spectra have been recorded from the same SIGMA = 11 grain boundary of a high purity sapphire (alpha - Al2O3) bi-crystal that had previously been examined by high resolution electron microscopy. The energy-loss near-edge structure (ELNES) on the aluminium L2,3 edge of the bulk alpha-Al2O3 is consistent with previously published x-ray absorption near-edge spectra (XANES). The presence of the grain-boundary introduces additional fine structure on the L2,3 edge, which is extracted from the dominant bulk spectrum using the chemical-standard ''difference'' method. A comparison with various spectral ''fingerprints'' suggests that the structural environment of the Al cations within the boundary plane has a reduced point-group symmetry and coordination number. Quantitative analyses of spectral intensities indicate that the equivalent of a full monolayer of Al cations is involved in the structural change at the boundary. These experimental observations are consistent with a recently calculated low energy relaxed grain-boundary structure.
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页码:23 / 39
页数:17
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