INSTRUMENT FOR MEASURING ROUGHNESS OF SUPER-SMOOTH SURFACES

被引:0
|
作者
HILDEBRA.BP [1 ]
GORDON, RL [1 ]
机构
[1] BATTELLE MEM INST,NW LABS,RICHLAND,WA 99352
关键词
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:506 / 507
页数:2
相关论文
共 50 条
  • [1] ROUGHNESS MEASURING INSTRUMENT FOR SUPER-SMOOTH SURFACE BY LASER-LIGHT SCATTERING.
    Anon
    KOBELCO Technology Review, 1987, (02):
  • [2] A new system for measuring the roughness of the super-smooth surface
    Fan, W
    Zhang, SH
    Yao, Z
    Wen, W
    PROCEEDINGS OF THE FIRST INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION SCIENCE AND TECHNOLOGY, 1999, : 476 - 482
  • [3] OPTICAL-SYSTEM FOR MEASURING THE PROFILES OF SUPER-SMOOTH SURFACES
    DOWNS, MJ
    MCGIVERN, WH
    FERGUSON, HJ
    PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1985, 7 (04): : 211 - 215
  • [4] Super-smooth polishing on aspherical surfaces
    Ando, M
    Negishi, M
    Takimoto, M
    Deguchi, A
    Nakamura, N
    NANOTECHNOLOGY, 1995, 6 (04) : 111 - 120
  • [5] STUDIES OF SUPER-SMOOTH POLISHING ON ASPHERICAL SURFACES
    NEGISHI, M
    ANDO, M
    TAKIMOTO, M
    DEGUCHI, A
    NAKAMURA, N
    INTERNATIONAL JOURNAL OF THE JAPAN SOCIETY FOR PRECISION ENGINEERING, 1995, 29 (01): : 1 - 4
  • [7] Magnetorheological finishing technology for polishing super-smooth optical surfaces
    Cheng, Hao-Bo
    Feng, Zhi-Jing
    Wang, Ying-Wei
    Harbin Gongye Daxue Xuebao/Journal of Harbin Institute of Technology, 2005, 37 (04): : 433 - 436
  • [8] Roughness measurement and ion-beam polishing of super-smooth optical surfaces of fused quartz and optical ceramics
    Chkhalo, N. I.
    Churin, S. A.
    Pestov, A. E.
    Salashchenko, N. N.
    Vainer, Yu. A.
    Zorina, M. V.
    OPTICS EXPRESS, 2014, 22 (17): : 20094 - 20106
  • [9] INSTRUMENT FOR MEASURING ROUGHNESS OF SUPERSMOOTH SURFACES
    HILDEBRAND, BP
    GORDON, RL
    ALLEN, EV
    APPLIED OPTICS, 1974, 13 (01) : 177 - 180
  • [10] A high-precision coordinate measuring system for super-smooth polishing
    Negishi, M
    Deguchi, A
    Ando, M
    Takimoto, M
    Nakamura, N
    NANOTECHNOLOGY, 1995, 6 (04) : 139 - 147