IMPROVEMENTS IN ELECTROSTATIC DISCHARGE PERFORMANCE OF INGAASP SEMICONDUCTOR-LASERS BY FACET PASSIVATION

被引:34
作者
DECHIARO, LF
SANDROFF, CJ
机构
[1] Bellcore, Red Bank, NJ
关键词
D O I
10.1109/16.123478
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Chemically treating laser facets with aqueous sulfides can significantly improve the electrostatic discharge (ESD) performance of InGaAsP semiconductor lasers. Commercial lasers free of internal defects were subjected to forward-biased, Human Body Model ESD stress pulses. Devices passivated with sulfides exhibited a mean ESD failure voltage more than 400% higher than that of the untreated control group. Subsequent accelerated aging experiments suggest that a thick layer of oxide covering the laser facets, largely removed by the sulfide treatment, is responsible for the low ESD failure voltage on untreated devices. This suggests that sulfide passivation followed by facet encapsulation in a robust dielectric could result in permanent protection against ESD failure.
引用
收藏
页码:561 / 565
页数:5
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