IDENTIFICATION OF POSITIVE SECONDARY IONS IN STATIC SIMS SPECTRA OF POLY(METHYLMETHACRYLATE) USING THE DEUTERATED POLYMER

被引：31
作者：
BRINKHUIS, RHG [1 ]
VANOOIJ, WJ [1 ]
机构：
[1] COLORADO SCH MINES,DEPT CHEM,GOLDEN,CO 80401
来源：
SURFACE AND INTERFACE ANALYSIS | 1988年 / 11卷 / 04期
关键词：
D O I：
10.1002/sia.740110406
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：214 / 216
页数：3
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