SPECIMEN BACKINGS FOR PROTON-INDUCED X-RAY-EMISSION ANALYSIS

被引：20

作者：

RUSSELL, SB ^{[1
]}

SCHULTE, CW ^{[1
]}

FAIQ, S ^{[1
]}

CAMPBELL, JL ^{[1
]}

机构：

[1] UNIV GUELPH,DEPT PHYS,GUELPH N1G 2W1,ONTARIO,CANADA

来源：

ANALYTICAL CHEMISTRY | 1981年 / 53卷 / 03期

关键词：

D O I：

10.1021/ac00226a054

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：571 / 574

页数：4

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