A RELIABILITY TEST SYSTEM FOR EDUCATIONAL PURPOSES - BASIC DATA

被引:506
作者
BILLINTON, R
KUMAR, S
CHOWDHURY, N
CHU, K
DEBNATH, K
GOEL, L
KHAN, E
KOS, P
NOURBAKHSH, G
OTENGADJEI, J
机构
关键词
D O I
10.1109/59.32623
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1238 / 1244
页数:7
相关论文
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