Electron diffraction studies on thin films III powder patterns containing anomalies produced by secondary scattering

被引：10
作者：
Germer, LH [1 ]
机构：
[1] Bell Tel Labs, New York, NY USA
来源：
PHYSICAL REVIEW | 1942年 / 61卷 / 5/6期
关键词：
D O I：
10.1103/PhysRev.61.309
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：309 / 312
页数：4
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