ROLE OF MULTIPLE-SCATTERING IN X-RAY PHOTOELECTRON-SPECTROSCOPY AND AUGER-ELECTRON DIFFRACTION IN CRYSTALS

被引：111
作者：
EGELHOFF, WF
机构：
来源：
PHYSICAL REVIEW LETTERS | 1987年 / 59卷 / 05期
关键词：
D O I：
10.1103/PhysRevLett.59.559
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：559 / 562
页数：4
相关论文
共 46 条
[1]   DIFFRACTION EFFECTS IN BACKSCATTERING AND AUGER PRODUCTION NEAR CRYSTAL-SURFACES [J].
ANDERSEN, SK ;
HOWIE, A .
SURFACE SCIENCE, 1975, 50 (01) :197-214
[2]  
ARMITAGE AF, 1980, SURF SCI, V100, pL483, DOI 10.1016/0039-6028(80)90410-0
[3]   AN ANALYSIS OF ANGULAR DEPENDENT XPS PEAK INTENSITIES [J].
ARMSTRONG, RA ;
EGELHOFF, WF .
SURFACE SCIENCE, 1985, 154 (2-3) :L225-L232
[4]  
BAIRD RJ, 1977, PHYS REV B, V15, P666, DOI 10.1103/PhysRevB.15.666
[5]   CRYSTALLINE EFFECTS IN AUGER-ELECTRON SPECTROSCOPY [J].
BISHOP, HE ;
CHORNIK, B ;
LEGRESSUS, C ;
LEMOEL, A .
SURFACE AND INTERFACE ANALYSIS, 1984, 6 (03) :116-128
[6]   PHOTOELECTRON-SPECTROSCOPY AND SURFACE ORDER - SOME UPS AND XPS OBSERVATIONS ON AG(110) [J].
BRIGGS, D ;
MARBROW, RA ;
LAMBERT, RM .
SOLID STATE COMMUNICATIONS, 1978, 26 (01) :1-2
[7]  
BRIGGS D, 1983, PRACTICAL SURFACE AN, P136
[8]   DETERMINATION OF EPITAXIAL OVERLAYER STRUCTURES FROM HIGH-ENERGY ELECTRON-SCATTERING AND DIFFRACTION [J].
BULLOCK, EL ;
FADLEY, CS .
PHYSICAL REVIEW B, 1985, 31 (02) :1212-1215
[9]  
CARLSON TA, 1978, XRAY PHOTOELECTRON S, P184
[10]  
CARLSON TA, 1975, PHOTOELECTRON AUGER, P266
12345