MICRODEFECTS IN RELATIVELY FAST COOLING MTG YBCO SPECIMEN

被引：8
作者：
CHOW, JCL
FUNG, PCW
DU, ZL
YU, TF
MOK, YC
机构：
[1] ZHONGSHAN UNIV,DEPT PHYS,CANTON,PEOPLES R CHINA
[2] UNIV HONG KONG,ELECTRON MICROSCOPE UNIT,HONG KONG,HONG KONG
来源：
CRYOGENICS | 1994年 / 34卷 / 03期
关键词：
HIGH TC SUPERCONDUCTORS; MELT TEXTURED YBCO; MICRODEFECTS;
D O I：
10.1016/0011-2275(94)90176-7
中图分类号：
O414.1 [热力学];
学科分类号：
摘要：
We have carried out a microstructure analysis of an YBCO bulk sample prepared using a simplified version of the melt texture growth process. Using only a 200 kV transmission electron microscope and diamond knife to section our sample, we obtain micrographs showing clear lattice fringes with interference spacing around 13 angstrom. The boundaries of the bright and dark regions, which are believed to arise from variations in crystal composition, coincide with the occurrence of stacking faults, twin boundaries and other dislocations. This sample, being full of microdefects, carries a bulk critical current of 1.75 x 10(4) A cm-2.
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页码：245 / 250
页数：6
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