3-D UNBIASED MEASUREMENTS IN ELECTRON-MICROSCOPY

被引:0
作者
HOWARD, V
机构
来源
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1988年 / 93期
关键词
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Details of a new family of unbiased 'design-based' 3-D measurement techniques in microscopy are given. These methods are devoid of assumptions about feature shape, orientation or spatial distribution and are proving to be more efficient than previous techniques.
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页码:49 / 57
页数:9
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