THE IMPROVEMENT AND APPLICATION OF ION-BEAM EXCITED ACOUSTIC MICROSCOPY

被引：0
|
作者：
TATENO, H [1 ]
ONO, T [1 ]
NAGATA, J [1 ]
FUKAI, A [1 ]
机构：
[1] KAGOSHIMA UNIV,FAC SCI,DEPT PHYS,KAGOSHIMA 890,JAPAN
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1987年 / 26卷
关键词：
D O I：
10.7567/JJAPS.26S1.242
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：242 / 244
页数：3
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