THE IMPROVEMENT AND APPLICATION OF ION-BEAM EXCITED ACOUSTIC MICROSCOPY

被引：0

作者：

TATENO, H ^{[1
]}

ONO, T ^{[1
]}

NAGATA, J ^{[1
]}

FUKAI, A ^{[1
]}

机构：

[1] KAGOSHIMA UNIV,FAC SCI,DEPT PHYS,KAGOSHIMA 890,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1987年 / 26卷

关键词：

D O I：

10.7567/JJAPS.26S1.242

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：242 / 244

页数：3

共 50 条

[21] NONLINEAR ION-ACOUSTIC SOLITARY WAVES IN ION-BEAM PLASMA
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[22] RADIATION CHARACTERISTICS OF ION-ACOUSTIC WAVES IN A SUPERSONIC ION-BEAM
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[23] DRESSED ION-ACOUSTIC SOLITON IN AN ION-BEAM PLASMA SYSTEM
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[24] ELECTROSTATIC INSTABILITIES AND ANOMALOUS TRANSPORT EXCITED BY AN ENERGETIC ION-BEAM
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[25] AN ALFVEN RESONATOR EXCITED IN THE IONOSPHERE AS A RESULT OF ION-BEAM INJECTION
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[27] ON THE APPLICATION OF DARKEN ANALYSIS TO ION-BEAM MIXING
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[28] STABILITY LIMITS OF ION-BEAM EXCITED ELECTROSTATIC ION-CYCLOTRON INSTABILITY
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[29] ION BEAM-PLASMA WAVE MODES AND ION-BEAM DECELERATION BY ION-ACOUSTIC TURBULENCE
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[30] THE APPLICATION OF CHANNELING TO MASKED ION-BEAM LITHOGRAPHY
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