THE IMPROVEMENT AND APPLICATION OF ION-BEAM EXCITED ACOUSTIC MICROSCOPY

被引:0
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作者
TATENO, H [1 ]
ONO, T [1 ]
NAGATA, J [1 ]
FUKAI, A [1 ]
机构
[1] KAGOSHIMA UNIV,FAC SCI,DEPT PHYS,KAGOSHIMA 890,JAPAN
关键词
D O I
10.7567/JJAPS.26S1.242
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:242 / 244
页数:3
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