A NEW MEASUREMENT METHOD FOR NOISE PARAMETERS

被引：0
|
作者：
BAREAU, P
PACAUD, A
机构：
来源：
ONDE ELECTRIQUE | 1994年 / 74卷 / 06期
关键词：
BIPOLAR TRANSISTOR; MICROWAVE TRANSISTOR; MEASUREMENT METHOD; AUTOMATIC MEASUREMENT; NOISE FIGURE; MEASUREMENT ERRORS; IMPEDANCE MATCHING;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We propose in this paper a new measurement method of noise parameters. Using this method, we don't need a microwave tuner for varying the input impedance and the noise source can be highly mismatched. We measured with this method the four noise parameters of a bipolar transistor and compared the results with theoretical predeterminations.
引用
收藏
页码：37 / 41
页数：5
相关论文
共 50 条
  • [1] A new noise measurement method of noise parameters at microwave frequencies
    Bareau, P
    Abdipour, A
    Pacaud, A
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1997, 46 (04) : 1044 - 1048
  • [2] New noise measurement method of noise parameters at microwave frequencies
    Ecole Superieure d'Eelectricite, Gif sur Yvette, France
    IEEE Trans Instrum Meas, 4 (1044-1048):
  • [3] A NEW METHOD FOR THE MEASUREMENT AND ANALYSIS OF NOISE PARAMETERS FOR MESFETS AND HEMTS
    NISHIDA, M
    UDA, H
    HARADA, Y
    INTERNATIONAL JOURNAL OF MICROWAVE AND MILLIMETER-WAVE COMPUTER-AIDED ENGINEERING, 1993, 3 (03): : 221 - 229
  • [4] A NEW MEASUREMENT METHOD OF THE NOISE PARAMETERS OF 2-PORT DEVICES
    FANELLI, N
    MICROWAVE JOURNAL, 1983, 26 (05) : 70 - &
  • [5] A NEW MEASUREMENT METHOD OF THE NOISE PARAMETERS OF 2-PORT DEVICES
    FANELLI, N
    MICROWAVES & RF, 1983, 22 (05) : 94 - 94
  • [6] A NEW METHOD FOR ON WAFER NOISE MEASUREMENT
    DAMBRINE, G
    HAPPY, H
    DANNEVILLE, F
    CAPPY, A
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1993, 41 (03) : 375 - 381
  • [7] A new method for phase noise measurement
    Angrisani, L
    Baccigalupi, A
    D'Arco, M
    IMTC 2002: PROCEEDINGS OF THE 19TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 & 2, 2002, : 663 - 668
  • [8] A new effective method removing measurement noise
    Liu, DH
    Sun, XY
    Gao, N
    Sun, HQ
    He, Y
    FIFTH INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION AND CONTROL TECHNOLOGY, 2003, 5253 : 345 - 349
  • [9] NEW METHOD OF MEASUREMENT OF DIODE JUNCTION PARAMETERS
    COERVER, LE
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1969, ED16 (12) : 1082 - &
  • [10] A New Method of Noncontact Measurement of the Plane Parameters
    Tang Wu-Sheng
    Tan Qing-Chang
    Li Qing-Hua
    Wu Li
    2009 IEEE INTERNATIONAL CONFERENCE ON MECHATRONICS AND AUTOMATION, VOLS 1-7, CONFERENCE PROCEEDINGS, 2009, : 2554 - +
12345