ATOMIC FORCE MICROSCOPE

被引：0
|
作者：
TSUDA, N
机构：
来源：
INTERNATIONAL JOURNAL OF THE JAPAN SOCIETY FOR PRECISION ENGINEERING | 1991年 / 25卷 / 04期
关键词：
ATOMIC FORCE MICROSCOPE (AFM); SIO2; LEVER; ATOMIC LEVEL FRICTION; PMMA GRATING MEASUREMENT;
D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
引用
收藏
页码：253 / 258
页数：6
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