PULSED ELECTRON-BEAMS FOR ANNEALING OF ION-IMPLANTED SILICON

被引:4
|
作者
LITTLE, RG
GREENWALD, AC
MINNUCCI, JA
机构
关键词
D O I
10.1109/TNS.1979.4330462
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1683 / 1685
页数:3
相关论文
共 50 条
  • [21] LASER ANNEALING OF ION-IMPLANTED SILICON
    WHITE, CW
    APPLETON, BR
    WILSON, SR
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (02) : 1759 - 1762
  • [22] PULSED ELECTRON-BEAM ANNEALING OF ION-IMPLANTED SI LAYERS
    KENNEDY, EF
    LAU, SS
    GOLECKI, I
    MAYER, JW
    TSENG, W
    MINNUCCI, JA
    KIRKPATRICK, AR
    RADIATION EFFECTS LETTERS, 1979, 43 (01): : 31 - 36
  • [23] PULSED EXCIMER AND CO2-LASER ANNEALING OF ION-IMPLANTED SILICON
    NARAYAN, J
    JAMES, RB
    HOLLAND, OW
    AZIZ, MJ
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (04): : 1836 - 1838
  • [24] THRESHOLD ENERGY DENSITY FOR PULSED-LASER ANNEALING OF ION-IMPLANTED SILICON
    HOONHOUT, D
    SARIS, FW
    JOURNAL OF APPLIED PHYSICS, 1982, 53 (06) : 4379 - 4388
  • [25] COMMENTS ON THE PLASMA ANNEALING MODEL TO EXPLAIN THE DYNAMICS OF PULSED LASER ANNEALING OF ION-IMPLANTED SILICON
    BHATTACHARYYA, A
    STREETMAN, BG
    HESS, K
    JOURNAL OF APPLIED PHYSICS, 1982, 53 (02) : 1261 - 1261
  • [26] BLINK FURNACE ANNEALING OF ION-IMPLANTED SILICON
    KUGIMIYA, K
    FUSE, G
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1982, 21 (01): : L16 - L18
  • [27] ANNEALING OF LATTICE DAMAGE IN ION-IMPLANTED SILICON
    TKACHEV, VD
    SCHRODEL, C
    MUDRYI, AV
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1980, 49 (1-3): : 133 - 136
  • [28] EXCIMER LASER ANNEALING OF ION-IMPLANTED SILICON
    NARAYAN, J
    HOLLAND, OW
    WHITE, CW
    YOUNG, RT
    JOURNAL OF APPLIED PHYSICS, 1984, 55 (04) : 1125 - 1130
  • [29] ANNEALING OF LOW FLUENCE ION-IMPLANTED SILICON
    PRUSSIN, SA
    VONDEROHE, W
    WITTE, RS
    JOURNAL OF ELECTRONIC MATERIALS, 1979, 8 (05) : 715 - 715
  • [30] FLASH LAMP ANNEALING OF ION-IMPLANTED SILICON
    HEINIG, KH
    HOHMUTH, K
    KLABES, R
    VOELSKOW, M
    WOITTENNEK, H
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1982, 63 (1-4): : 115 - 123