SCANNING TUNNELING MICROSCOPY OF COMPACT DISK SURFACES

被引：25

作者：

SEXTON, BA

COTTERILL, GF

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1989年 / 7卷 / 04期

关键词：

D O I：

10.1116/1.575783

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：2734 / 2740

页数：7

共 11 条

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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1988, 6 (02): : 408 - 411
[2] SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY
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SMITH, DPE
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[3] SCANNING TUNNELING MICROSCOPY OF MACHINED SURFACES
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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 432 - 435
[4] GREN M, 1988, J VAC SCI TECHNOL A, V6, P428
[5] OBSERVATION OF PN JUNCTIONS ON IMPLANTED SILICON USING A SCANNING TUNNELING MICROSCOPE
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NATSUAKI, N
[J]. APPLIED PHYSICS LETTERS, 1988, 53 (06) : 487 - 489
[6] IBBOTSON P, COMMUNICATION
[7] ULTRATHIN AU FILMS STUDIED WITH THE SCANNING TUNNELING MICROSCOPE - TOPOGRAPHY OF INSULATING SURFACES
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ELIE, L
SHEN, W
CHEN, JT
[J]. APPLIED PHYSICS LETTERS, 1988, 52 (20) : 1656 - 1657
[8] APPLICATION OF THE SCANNING TUNNELING MICROSCOPE TO INSULATING SURFACES
JAKLEVIC, RC
ELIE, L
SHEN, W
CHEN, JT
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 448 - 453
[9] Muller E W, 1969, FIELD ION MICROSCOPY
[10] OBSERVATION OF MICROFABRICATED PATTERNS BY SCANNING TUNNELING MICROSCOPY
OKAYAMA, S
KOMURO, M
MIZUTANI, W
TOKUMOTO, H
OKANO, M
SHIMIZU, K
KOBAYASHI, Y
MATSUMOTO, F
WAKIYAMA, S
SHIGENO, M
SAKAI, F
FUJIWARA, S
KITAMURA, O
ONO, M
KAJIMURA, K
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 440 - 444

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