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WATER-RELATED CHARGE MOTION IN DIELECTRICS
被引:16
作者
:
LIFSHITZ, N
论文数:
0
引用数:
0
h-index:
0
LIFSHITZ, N
SMOLINSKY, G
论文数:
0
引用数:
0
h-index:
0
SMOLINSKY, G
机构
:
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1989年
/ 136卷
/ 08期
关键词
:
D O I
:
10.1149/1.2097338
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:2335 / 2340
页数:6
相关论文
共 8 条
[1]
AN INVESTIGATION OF INSTABILITY AND CHARGE MOTION IN METAL-SILICON OXIDE-SILICON STRUCTURES
HOFSTEIN, SR
论文数:
0
引用数:
0
h-index:
0
HOFSTEIN, SR
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1966,
ED13
(02)
: 222
-
+
[2]
IONIC CONTAMINATION AND TRANSPORT OF MOBILE IONS IN MOS STRUCTURES
KUHN, M
论文数:
0
引用数:
0
h-index:
0
KUHN, M
SILVERSMITH, DJ
论文数:
0
引用数:
0
h-index:
0
SILVERSMITH, DJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1971,
118
(06)
: 966
-
+
[3]
MOBILE CHARGE IN A NOVEL SPIN-ON OXIDE (SOX) - DETECTION OF HYDROGEN IN DIELECTRICS
LIFSHITZ, N
论文数:
0
引用数:
0
h-index:
0
LIFSHITZ, N
SMOLINSKY, G
论文数:
0
引用数:
0
h-index:
0
SMOLINSKY, G
ANDREWS, JM
论文数:
0
引用数:
0
h-index:
0
ANDREWS, JM
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1989,
136
(05)
: 1440
-
1446
[4]
NICOLLIAN EH, 1982, MOS PHYSICS TECHNOLO, P532
[5]
COMPARISONS OF INSTABILITIES IN SCALED CMOS DEVICES BETWEEN PLASTIC AND HERMETICALLY ENCAPSULATED DEVICES
NOYORI, M
论文数:
0
引用数:
0
h-index:
0
NOYORI, M
NAKATA, Y
论文数:
0
引用数:
0
h-index:
0
NAKATA, Y
SHIRAGASAWA, T
论文数:
0
引用数:
0
h-index:
0
SHIRAGASAWA, T
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1983,
30
(10)
: 1305
-
1313
[6]
CHARACTERISTICS AND ANALYSIS OF INSTABILITY INDUCED BY SECONDARY SLOW TRAPPING IN SCALED CMOS DEVICES
NOYORI, M
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA ELECTR CORP,KYOTO 617,JAPAN
MATSUSHITA ELECTR CORP,KYOTO 617,JAPAN
NOYORI, M
YASUI, J
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA ELECTR CORP,KYOTO 617,JAPAN
MATSUSHITA ELECTR CORP,KYOTO 617,JAPAN
YASUI, J
ISHIHARA, T
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA ELECTR CORP,KYOTO 617,JAPAN
MATSUSHITA ELECTR CORP,KYOTO 617,JAPAN
ISHIHARA, T
HIGUCHI, H
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA ELECTR CORP,KYOTO 617,JAPAN
MATSUSHITA ELECTR CORP,KYOTO 617,JAPAN
HIGUCHI, H
[J].
IEEE TRANSACTIONS ON RELIABILITY,
1983,
32
(03)
: 323
-
330
[7]
Sun R. C., 1980, 18th Annual Proceedings of Reliability Physics, P244, DOI 10.1109/IRPS.1980.362948
[8]
PREPARATION OF HIGH-SILICA GLASSES FROM COLLOIDAL GELS .3. INFRARED SPECTROPHOTOMETRIC STUDIES
WOOD, DL
论文数:
0
引用数:
0
h-index:
0
WOOD, DL
RABINOVICH, EM
论文数:
0
引用数:
0
h-index:
0
RABINOVICH, EM
JOHNSON, DW
论文数:
0
引用数:
0
h-index:
0
JOHNSON, DW
MACCHESNEY, JB
论文数:
0
引用数:
0
h-index:
0
MACCHESNEY, JB
VOGEL, EM
论文数:
0
引用数:
0
h-index:
0
VOGEL, EM
[J].
JOURNAL OF THE AMERICAN CERAMIC SOCIETY,
1983,
66
(10)
: 693
-
699
←
1
→
共 8 条
[1]
AN INVESTIGATION OF INSTABILITY AND CHARGE MOTION IN METAL-SILICON OXIDE-SILICON STRUCTURES
HOFSTEIN, SR
论文数:
0
引用数:
0
h-index:
0
HOFSTEIN, SR
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1966,
ED13
(02)
: 222
-
+
[2]
IONIC CONTAMINATION AND TRANSPORT OF MOBILE IONS IN MOS STRUCTURES
KUHN, M
论文数:
0
引用数:
0
h-index:
0
KUHN, M
SILVERSMITH, DJ
论文数:
0
引用数:
0
h-index:
0
SILVERSMITH, DJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1971,
118
(06)
: 966
-
+
[3]
MOBILE CHARGE IN A NOVEL SPIN-ON OXIDE (SOX) - DETECTION OF HYDROGEN IN DIELECTRICS
LIFSHITZ, N
论文数:
0
引用数:
0
h-index:
0
LIFSHITZ, N
SMOLINSKY, G
论文数:
0
引用数:
0
h-index:
0
SMOLINSKY, G
ANDREWS, JM
论文数:
0
引用数:
0
h-index:
0
ANDREWS, JM
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1989,
136
(05)
: 1440
-
1446
[4]
NICOLLIAN EH, 1982, MOS PHYSICS TECHNOLO, P532
[5]
COMPARISONS OF INSTABILITIES IN SCALED CMOS DEVICES BETWEEN PLASTIC AND HERMETICALLY ENCAPSULATED DEVICES
NOYORI, M
论文数:
0
引用数:
0
h-index:
0
NOYORI, M
NAKATA, Y
论文数:
0
引用数:
0
h-index:
0
NAKATA, Y
SHIRAGASAWA, T
论文数:
0
引用数:
0
h-index:
0
SHIRAGASAWA, T
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1983,
30
(10)
: 1305
-
1313
[6]
CHARACTERISTICS AND ANALYSIS OF INSTABILITY INDUCED BY SECONDARY SLOW TRAPPING IN SCALED CMOS DEVICES
NOYORI, M
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA ELECTR CORP,KYOTO 617,JAPAN
MATSUSHITA ELECTR CORP,KYOTO 617,JAPAN
NOYORI, M
YASUI, J
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA ELECTR CORP,KYOTO 617,JAPAN
MATSUSHITA ELECTR CORP,KYOTO 617,JAPAN
YASUI, J
ISHIHARA, T
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA ELECTR CORP,KYOTO 617,JAPAN
MATSUSHITA ELECTR CORP,KYOTO 617,JAPAN
ISHIHARA, T
HIGUCHI, H
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA ELECTR CORP,KYOTO 617,JAPAN
MATSUSHITA ELECTR CORP,KYOTO 617,JAPAN
HIGUCHI, H
[J].
IEEE TRANSACTIONS ON RELIABILITY,
1983,
32
(03)
: 323
-
330
[7]
Sun R. C., 1980, 18th Annual Proceedings of Reliability Physics, P244, DOI 10.1109/IRPS.1980.362948
[8]
PREPARATION OF HIGH-SILICA GLASSES FROM COLLOIDAL GELS .3. INFRARED SPECTROPHOTOMETRIC STUDIES
WOOD, DL
论文数:
0
引用数:
0
h-index:
0
WOOD, DL
RABINOVICH, EM
论文数:
0
引用数:
0
h-index:
0
RABINOVICH, EM
JOHNSON, DW
论文数:
0
引用数:
0
h-index:
0
JOHNSON, DW
MACCHESNEY, JB
论文数:
0
引用数:
0
h-index:
0
MACCHESNEY, JB
VOGEL, EM
论文数:
0
引用数:
0
h-index:
0
VOGEL, EM
[J].
JOURNAL OF THE AMERICAN CERAMIC SOCIETY,
1983,
66
(10)
: 693
-
699
←
1
→