HIGH-RESOLUTION X-RAY-DIFFRACTION STUDIES OF INGAAS(P)/INP SUPERLATTICES GROWN BY GAS-SOURCE MOLECULAR-BEAM EPITAXY

被引：89
作者：
VANDENBERG, JM
HAMM, RA
PANISH, MB
TEMKIN, H
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1987年 / 62卷 / 04期
关键词：
D O I：
10.1063/1.339681
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：1278 / 1283
页数：6
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