MEASURING THE THICKNESS OF Z-CUT UNIAXIAL CRYSTALS BASED ON BESSEL LASER BEAMS

被引：0
|
作者：
Paranin, V. D. [1 ]
机构：
[1] Samara Natl Res Univ, Samara, Russia
来源：
COMPUTER OPTICS | 2016年 / 40卷 / 04期
基金：
俄罗斯基础研究基金会;
关键词：
Bessel beam; birefringence crystal; lithium niobate; thickness measurement; tolerance; image processing;
D O I：
10.18287/2412-6179-2016-40-4-594-599
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
An optical method for measuring the thickness of z-cut uniaxial crystals is proposed. The method uses a periodic mutual conversion of zero-and second-order Bessel beams observed during their propagation along the optical axis of a uniaxial crystal. The paper presents the theoretical background and features of the practical implementation of the measuring method. The applicability of the method for measuring thicknesses ranging from tens of micrometers up to tens of millimeters is shown for a lithium niobate crystal.
引用
收藏
页码：594 / 599
页数：6
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