TWINS AND INTERGROWTH DEFECTS IN HIGH-TC BI-SR-CA-CU-O SUPERCONDUCTOR EXAMINED BY HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：68
作者：
MATSUI, Y
MAEDA, H
TANAKA, Y
TAKAYAMAMUROMACHI, E
TAKEKAWA, S
HORIUCHI, S
机构：
[1] NATL RES INST MET,TSUKUBA LAB,TSUKUBA,IBARAKI 305,JAPAN
[2] NATL INST RES INORGAN MAT,SAKURA,IBARAKI 305,JAPAN
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1988年 / 27卷 / 05期
关键词：
D O I：
10.1143/JJAP.27.L827
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：L827 / L829
页数：3
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