QUANTITATIVE COMPARISON OF TI AND TIO SURFACES USING AUGER-ELECTRON AND SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPIES

被引：52
作者：
GRANT, JT
HAAS, TW
HOUSTON, JE
机构：
[1] SANDIA LABS,ALBUQUERQUE,NM 87115
[2] AEROSP RES LABS,WRIGHT PATTERSON AFB,OH 45433
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1974年 / 11卷 / 01期
关键词：
D O I：
10.1116/1.1318575
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：227 / 230
页数：4
相关论文
共 16 条
[1]   QUANTITATIVE AUGER ANALYSIS USING INTEGRATION TECHNIQUES [J].
GRANT, JT ;
HAAS, TW ;
HOUSTON, JE .
PHYSICS LETTERS A, 1973, A 45 (04) :309-310
[2]  
Haas T. W., 1970, Applied Physics Letters, V16, P172, DOI 10.1063/1.1653149
[3]   SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPY IN A DISPLAY LEED SYSTEM [J].
HAAS, TW ;
THOMAS, S ;
DOOLEY, GJ .
SURFACE SCIENCE, 1971, 28 (02) :645-&
[4]   ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J].
HARRIS, LA .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) :1419-&
[5]   EXACT CORRECTIONS FOR POTENTIAL MODULATION DISTORTION IN AUGER YIELD MEASUREMENTS [J].
HOUSTON, JE .
SURFACE SCIENCE, 1973, 38 (02) :283-291
[6]   EFFECT OF OXYGEN ON SOFT X-RAY APPEARANCE POTENTIAL SPECTRUM OF CHROMIUM [J].
HOUSTON, JE ;
PARK, RL .
JOURNAL OF CHEMICAL PHYSICS, 1971, 55 (09) :4601-&
[7]   INSTRUMENT RESPONSE FUNCTIONS FOR POTENTIAL MODULATION DIFFERENTIATION [J].
HOUSTON, JE ;
PARK, RL .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (10) :1437-&
[8]  
HOUSTON JE, UNPUBLISHED
[9]   IMPROVED ELECTRICAL DIFFERENTIATION OF RETARDING POTENTIAL MEASUREMENTS [J].
LEDER, LB ;
SIMPSON, JA .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1958, 29 (07) :571-574
[10]  
MEYER F, PRIVATE COMMUNICATIO
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