MECHANISM OF THE NOISE-REDUCTION METHOD BY SUPERPOSITION OF HIGH-FREQUENCY CURRENT FOR SEMICONDUCTOR INJECTION-LASERS

被引:36
作者
YAMADA, M
HIGASHI, T
机构
[1] Department of Electrical and Computer Engineering, Faculty of Technology, Kanazawa University, Kodatsuno, Kanazawa
关键词
D O I
10.1109/3.81335
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The semiconductor injection lasers sometime reveal excess noise called the mode hopping noise, which is associated with the mode hopping phenomena among longitudinal modes. The mode hopping phenomena are caused by coupling effects among lasing modes. To reduce this kind of noise, a method by superposition of high-frequency (HF) current on the injection current is popularly used. Mechanism of this reduction method is theoretically analyzed based on the mode competition theory and is compared with experimental measurements in this paper. We confirmed that the coupling effect among the longitudinal modes are released with the HF superposition because of enhanced vibration of the injected electron, resulting in reduction of the mode hopping noise. Reducing efficiencies are also discussed in relation of operating conditions such as driving frequency, current intensity, thermal effect, and device parameters.
引用
收藏
页码:380 / 388
页数:9
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