UNIFORM-FIELD BREAKDOWN-VOLTAGE MEASUREMENTS IN SULFUR HEXAFLUORIDE

被引:12
作者
BOYD, HA
CRICHTON, GC
机构
来源
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON | 1972年 / 119卷 / 02期
关键词
D O I
10.1049/piee.1972.0063
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
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页码:275 / &
相关论文
共 6 条
[1]   MEASUREMENT OF IONIZATION AND ATTACHMENT COEFFICIENTS IN SULPHUR HEXAFLUORIDE IN UNIFORM FIELDS [J].
BHALLA, MS ;
CRAGGS, JD .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1962, 80 (513) :151-&
[2]   MEASUREMENT OF IONIZATION AND ATTACHMENT COEFFICIENTS IN SF6 [J].
BOYD, HA ;
CRICHTON, GC .
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1971, 118 (12) :1872-&
[3]  
Bruce F.M., 1947, J I ELECT ENG PART 2, V94, P138
[4]  
CRICHTON GC, 1969, THESIS U STRATHCLYDE
[5]   DEPARTURES FROM PASCHENS LAW FOR SULPHUR HEXAFLUORIDE [J].
DUTTON, J .
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1971, 118 (05) :732-&
[6]   ELECTRICAL FIELD BREAKDOWN IN SULPHUR HEXAFLUORIDE [J].
GEORGE, DW ;
RICHARDS, PH .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1969, 2 (10) :1470-&