ELECTRON-BEAM TESTING OF INTEGRATED-CIRCUITS USING A PICOSECOND PHOTOELECTRON SCANNING ELECTRON-MICROSCOPE

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作者：

PASTOL, Y

HALBOUT, JM

MAY, P

CHIU, G

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SCANNING MICROSCOPY | 1989年 / 3卷 / 02期

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TH742 [显微镜];

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页码：443 / 447

页数：5

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