ORIGINS OF SECONDARY-ELECTRON SIGNAL IN SCANNING ELECTRON-MICROSCOPY

被引：13
|
作者：
ROBINSON, VN [1 ]
机构：
[1] UNIV NEW S WALES,SCH TEXT TECHNOL,POB 1,KENSINGTON 2033,NEW S WALES,AUSTRALIA
来源：
JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1974年 / 7卷 / 16期
关键词：
D O I：
10.1088/0022-3727/7/16/304
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：2169 / 2173
页数：5
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