ORIGINS OF SECONDARY-ELECTRON SIGNAL IN SCANNING ELECTRON-MICROSCOPY

被引:13
|
作者
ROBINSON, VN [1 ]
机构
[1] UNIV NEW S WALES,SCH TEXT TECHNOL,POB 1,KENSINGTON 2033,NEW S WALES,AUSTRALIA
关键词
D O I
10.1088/0022-3727/7/16/304
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:2169 / 2173
页数:5
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