ORIGINS OF SECONDARY-ELECTRON SIGNAL IN SCANNING ELECTRON-MICROSCOPY

被引：13

作者：

ROBINSON, VN ^{[1
]}

机构：

[1] UNIV NEW S WALES,SCH TEXT TECHNOL,POB 1,KENSINGTON 2033,NEW S WALES,AUSTRALIA

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1974年 / 7卷 / 16期

关键词：

D O I：

10.1088/0022-3727/7/16/304

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2169 / 2173

页数：5

共 50 条

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[7] MAGNETIC CONTRAST IN SECONDARY-ELECTRON IMAGES OF UNIAXIAL FERROMAGNETIC MATERIALS OBTAINED BY SCANNING ELECTRON-MICROSCOPY
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[8] SECONDARY-ELECTRON AND ION IMAGING IN SCANNING ION MICROSCOPY
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